Watanabe, Shinichi

写真a

Affiliation

Faculty of Science and Technology, Department of Physics (Yagami)

Position

Professor

External Links

Career 【 Display / hide

  • 1999.04
    -
    2002.03

    Research Fellow of the Japan Society for the Promotion of Science (DC1)

  • 2002.04
    -
    2004.03

    JSPS Postdoctoral Fellow for Research Abroad

  • 2002.04
    -
    2004.03

    JSPS Postdoctoral Fellow for Research Abroad

  • 2004.04
    -
    2004.07

    Collaborator Scientific

  • 2004.04
    -
    2004.07

    Collaborator Scientific

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Academic Background 【 Display / hide

  • 1997.03

    The University of Tokyo, Faculty of Science, Department of Physics

    University, Graduated

  • 1999.03

    The University of Tokyo, Graduate School of Science, Physics Department

    Graduate School, Completed, Master's course

  • 2002.03

    The University of Tokyo, Graduate School of Science, Physics Department

    Graduate School, Completed, Doctoral course

Academic Degrees 【 Display / hide

  • Doctor of Science, The University of Tokyo, Coursework, 2002.03

 

Research Areas 【 Display / hide

  • Natural Science / Semiconductors, optical properties of condensed matter and atomic physics (Physical Properties I)

  • Nanotechnology/Materials / Optical engineering and photon science (Applied Optics/Quantum Optical Engineering)

Research Keywords 【 Display / hide

  • Terahertz Spectroscopy

  • Semiconductor Nanostructures

  • Organic Conductors

  • Ultrafast Spectroscopy

 

Books 【 Display / hide

  • 基礎高分子科学 第2版

    渡邉 紳一, 2020.01

Papers 【 Display / hide

  • Temporal-offset dual-comb vibrometer with picometer axial precision

    A. Iwasaki, D. Nishikawa, M. Okano, S. Tateno, K. Yamanoi, Y. Nozaki, S. Watanabe

     2022.03

     View Summary

    We demonstrate a dual-comb vibrometer where the pulses of one frequency-comb
    are split into pulse pairs. We introduce a delay between the two pulses of each
    pulse pair in front of the sample, and after the corresponding two consecutive
    reflections at the vibrating sample surface, the initially introduced delay is
    cancelled by a modified Sagnac geometry. The remaining phase difference between
    the two pulses corresponds to the change in the axial position of the surface
    during the two consecutive reflections. The Sagnac geometry reduces the effect
    of phase jitter since both pulses propagate through nearly the same optical
    path (in opposite directions), and spurious signals are eliminated by time
    gating. We determine the amplitude of a surface vibration on a
    surface-acoustic-wave device with an axial precision of 4 pm. This technique
    enables highly accurate determination of extremely small displacements.

  • Ultra-precise determination of thicknesses and refractive indices of optically thick dispersive materials by dual-comb spectroscopy.

    Kana A Sumihara, Sho Okubo, Makoto Okano, Hajime Inaba, Shinichi Watanabe

    Optics express (Optics Express)  30 ( 2 ) 2734 - 2747 2022.01

     View Summary

    Precise measurements of the geometrical thickness of a sample and its refractive index are important for materials science, engineering, and medical diagnosis. Among the possible non-contact evaluation methods, optical interferometric techniques possess the potential of providing superior resolution. However, in the optical frequency region, the ambiguity in the absolute phase-shift makes it difficult to measure these parameters of optically thick dispersive materials with sufficient resolution. Here, we demonstrate that dual frequency-comb spectroscopy can be used to precisely determine the absolute sample-induced phase-shift by analyzing the data smoothness. This method enables simultaneous determination of the geometrical thickness and the refractive index of a planar sample with a precision of five and a half digits. The thickness and the refractive index at 193.414 THz (λ = 1550 nm) of a silicon wafer determined by this method are 0.5204737(19) mm and 3.475625(58), respectively, without any prior knowledge of the refractive index.

  • Interferogram-based determination of the absolute mode numbers of optical frequency combs in dual-comb spectroscopy

    Fukuda T, Okano M, Watanabe S

    Optics Express (Optics Express)  29 ( 14 ) 22214 - 22227 2021.07

     View Summary

    Dual-comb spectroscopy (DCS), which uses two optical frequency combs (OFCs), requires an accurate knowledge of the mode number of each comb line to determine spectral features. We demonstrate a fast evaluation method of the absolute mode numbers of both OFCs used in DCS system. By measuring the interval between the peaks in the time-domain interferogram, it is possible to accurately determine the ratio of one OFC repetition frequency (frep) to the difference between the frep values of the two OFCs (∆frep). The absolute mode numbers can then be straightforwardly calculated using this ratio. This method is applicable to a broad range of ∆frep values down to several Hz without any additional instruments. For instance, the minimum required measurement time is estimated to be about 1 s for ∆frep ≈ 5.6 Hz and frep ≈ 60 MHz. The optical frequencies of the absorption lines of acetylene gas obtained by DCS with our method of mode number determination shows good agreement with the data from the HITRAN database.

  • Ultra-Precise Complex Refractive Index Measurement Using Dual-Comb Spectroscopy

    Sumihara K.A., Okubo S., Okano M., Inaba H., Watanabe S.

    2021 Conference on Lasers and Electro-Optics, CLEO 2021 - Proceedings (2021 Conference on Lasers and Electro-Optics, CLEO 2021 - Proceedings)   2021.05

    ISSN  9781943580910

     View Summary

    We determined complex refractive index and thickness of a silicon wafer with unprecedented precision using dual-comb spectroscopy. The standard deviations of the refractive index and the thickness are 8.9×10-6 and 1.0 nm, respectively.

  • Ultra-precise complex refractive index measurement using dual-comb spectroscopy

    Sumihara K.A., Okubo S., Okano M., Inaba H., Watanabe S.

    Optics InfoBase Conference Papers (Optics InfoBase Conference Papers)   2021

    ISSN  9781557528209

     View Summary

    We determined complex refractive index and thickness of a silicon wafer with unprecedented precision using dual-comb spectroscopy. The standard deviations of the refractive index and the thickness are 8.9×10-6 and 1.0 nm, respectively.

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Papers, etc., Registered in KOARA 【 Display / hide

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Reviews, Commentaries, etc. 【 Display / hide

  • Polarization-sensitive terahertz time-domain spectroscopy system without mechanical moving parts

    Mayuri Nakagawa, Makoto Okano, Shinichi Watanabe

     2022.05

     View Summary

    We report on the measurement of terahertz electric-field vector waveforms by
    using a system that contains no mechanical moving parts. It is known that two
    phase-locked femtosecond lasers with different repetition rates can be used to
    perform time-domain spectroscopy without using a mechanical delay stage.
    Furthermore, an electro-optic modulator can be used to perform polarization
    measurements without rotating any polarizers or waveplates. We experimentally
    demonstrate the combination of these two methods and explain the analysis of
    data obtained by such a system. Such a system provides a robust platform that
    can promote the usage of polarization-sensitive terahertz time-domain
    spectroscopy in basic science and practical applications. For the experimental
    demonstration, we alter the polarization of a terahertz wave by a polarizer.

  • テラヘルツセンシングで見えるもの~高分子材料評価への応用~

    渡邉紳一, 岡野真人

    一般財団法人電波技術協会 協会報FORN  ( 11 )  2020.11

    Article, review, commentary, editorial, etc. (trade magazine, newspaper, online media), Joint Work

  • テラヘルツ分光技術の化学・生命科学への応用

    渡邉紳一

    光学 48 ( 10 ) 396 - 401 2019.10

    Article, review, commentary, editorial, etc. (scientific journal), Single Work

  • テラヘルツ偏光計測による高分子材料の内部異方性検査

    岡野真人, 渡邉紳一

    プラスチックス  ( 10 ) 22 - 25 2019.10

    Article, review, commentary, editorial, etc. (trade magazine, newspaper, online media), Joint Work

  • 高分子材料における異方性のテラヘルツセンシング

    渡邉 紳一、岡野 真人、中迫 雅由

    レーザー研究 (一般社団法人レーザー学会)  47 ( 1 ) 21 - 26 2019.02

    Article, review, commentary, editorial, etc. (scientific journal), Joint Work

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Presentations 【 Display / hide

  • 複素誘電率スペクトル解析によるポリ乳酸薄膜の熱誘起状態変化の観測

    岡野真人, 中村円香, 渡邉紳一

    テラヘルツ科学の最先端VII, 

    2020.11

    Oral presentation (general)

  • 非同期サンプリング法によるテラヘルツ偏光分光測定装置の開発

    中川真由莉, 岡野真人, 渡邉紳一

    テラヘルツ科学の最先端VII, 

    2020.11

    Oral presentation (general)

  • テラヘルツ偏光計測によるゴム伸縮過程における内部カーボンナノフィラー構造変化の推定

    水田圭祐, 岡野真人, 森本崇宏, 阿多誠介, 渡邉紳一

    日本物理学会2020年秋季大会, 

    2020.09

    Poster presentation

  • ダブル光パルス励起による金属強磁性薄膜中の高次スピン波モードの制御

    岡野真人, 高橋知宏, 渡邉紳一

    Spin-RNJ 若手オンライン研究発表会, 

    2020.06

    Oral presentation (general)

  • Coherent control of higher-order spin precession modes in ferromagnetic permalloy thin films by double pulse excitation

    M. Okano, T. Takahashi, and S. Watanabe

    CLEO 2020, 

    2020.05

    Oral presentation (general)

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Research Projects of Competitive Funds, etc. 【 Display / hide

  • 高分子破壊現象プローブのための動的テラヘルツ劣化観察装置の開発

    2018.04
    -
    2021.03

    Grant-in-Aid for Scientific Research, Research grant, Principal investigator

  • テラヘルツ偏光イメージング分析技術の成果事業化検証のための装置開発

    2017.10
    -
    2018.03

    科学技術振興機構, 大学発新産業創出プログラム 社会還元加速プログラム(SCORE), Commissioned research, Principal investigator

  • 偏光コム分光法の創出

    2016.04
    -
    2018.03

    Grant-in-Aid for Scientific Research, Principal investigator

  • 高速・高精度テラヘルツ時間領域分光ポーラリメータの開発と産業応用展開

    2014.09
    -
    2019.03

    科学技術振興機構, 産学共創基礎基盤研究プログラム, Commissioned research, Principal investigator

  • 高速・高精度テラヘルツ偏光スペクトル計測を用いた非破壊・非接触イメージング技術の研究開発

    2014.08
    -
    2015.03

    総務省, 戦略的情報通信研究開発推進事業, Commissioned research, No Setting

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Works 【 Display / hide

  • テラヘルツ光で見るゴム深部のひずみ ─光でミクロの構造に迫る─

    渡邉紳一

    JSTニュース2017年9月号, 

    2017.09
    -
    Present

    Other, Single

  • 日経産業新聞 朝刊8面

    2017.01
    -
    Present

    Other, Joint

  • 化学工業日報 朝刊8面

    WATANABE SHINICHI

    2012.07
    -
    Present

    Other

  • 日経産業新聞 朝刊11面

    WATANABE SHINICHI

    2012.07
    -
    Present

    Other

  • 日刊工業新聞 朝刊17面

    WATANABE SHINICHI

    2012.07
    -
    Present

    Other

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Intellectual Property Rights, etc. 【 Display / hide

  • 光学測定装置、光学測定方法、及び応力検査方法

    Date applied: PCT/JP2017/030814  2017.08 

    Patent, Joint

  • 光学測定装置、光学測定方法、及び応力検査方法

    Date applied: 特願2016-167370  2016.08 

    Patent, Joint

  • デュアルコム分光法を用いた偏光計測装置及び偏光計測方法

    Date applied: 特願2016-017537  2016.02 

    Patent, Joint

  • 偏波解析装置、及び偏波解析方法

    Date applied: 特願2015-124617  2015.06 

    Patent, Joint

Awards 【 Display / hide

  • IAAM Scientist Medal

    Shinichi Watanabe, 2018.05, International Association of Advanced Materials, Terahertz polarization spectroscopy as a novel tool for nondestructive internal strain sensing of rubber and polymeric materials

    Country: Sweden

     View Description

    New Age Technology and Innovations 分野における著しく優れた研究による

  • 第42回(2017年春季)応用物理学会講演奨励賞受賞

    森脇淳仁、岡野真人、渡邉紳一, 2017.09, 応用物理学会, テラヘルツ偏光計測による黒色ゴム材料の内部歪みイメージング

  • Best Student Papers

    K. Sumihara, S. Okubo, M. Okano, H. Inaba, and S. Watanabe, 2017.03, Optical Society of America, Development of Precise Polarization Measurement System Using Dual-comb Spectroscopy

  • The Commendation for Science and Technology by the Minister of Education, Culture, Sports, Science and Technology, The Young Scientists’ Prize

    Shinichi Watanabe, 2014.04, Ministry of Education, Culture, Sports, Science and Technology, テラヘルツ新分光技術の開拓と物質科学応用に関する研究

  • Young Scientist Award of the Physical Society of Japan

    WATANABE SHINICHI, 2012.03, The Physical Society of Japan, Experimental studies on non-equilibrium carrier dynamics in low-dimensional organic materials by time-resolved terahertz spectroscopy

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Courses Taught 【 Display / hide

  • SOLID STATE PHYSICS 3

    2022

  • SOLID STATE PHYSICS 1

    2022

  • PHYSICS LABORATORIES 2

    2022

  • PHYSICS LABORATORIES 1

    2022

  • LITERATURE OF PHYSICS

    2022

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Courses Previously Taught 【 Display / hide

  • 物性物理学第1

    Keio University

    2020.04
    -
    2021.03

    Autumn Semester, Lecture

  • 物性物理学第3

    Keio University

    2020.04
    -
    2021.03

    Autumn Semester, Lecture, Lecturer outside of Keio

  • 物理学実験I,II

    Keio University

    2020.04
    -
    2021.03

    Full academic year, Laboratory work/practical work/exercise

  • 論文講読発表

    慶應義塾大学

    2020.04
    -
    2021.03

  • 自然科学実験

    Keio University

    2020.04
    -
    2021.03

    Spring Semester, Laboratory work/practical work/exercise

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Social Activities 【 Display / hide

  • 東京大学理学系COE合同若手シンポジウム実行委員会

    2006.02
    -
    2006.07

     View Summary

    物理学専攻教員代表

  • 第10回関東光科学若手研究会企画・運営

    2015.04
    -
    2015.10

Memberships in Academic Societies 【 Display / hide

  • テラヘルツテクノロジーフォーラム委員会,研究交流委員会,基礎部門, 

    2010.06
    -
    Present
  • 日本物理学会, 

    1997.06
    -
    Present
  • 応用物理学会, 

    2007.01
    -
    Present
  • 高分子学会, 

    2015.10
    -
    Present
  • The Optical Society (OSA), 

    2013.01
    -
    Present

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Committee Experiences 【 Display / hide

  • 2018.05
    -
    Present

    総務委員会委員長(理事), テラヘルツテクノロジーフォーラム

  • 2015.04
    -
    2018.05

    総務委員会委員, テラヘルツテクノロジーフォーラム

  • 2015.04
    -
    2017.03

    機関誌編集委員, 応用物理学会

  • 2012.04
    -
    2014.03

    新著紹介小委員会委員, 一般社団法人日本物理学会

  • 2010.06
    -
    Present

    委員, テラヘルツテクノロジーフォーラム委員会,研究交流委員会,基礎部門

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