Details of a Researcher - Watanabe, Shinichi

Watanabe, Shinichi

写真a

Affiliation: Faculty of Science and Technology, Department of Physics （Yagami）

Position: Professor

External Links

Career 【 Display / hide 】

1999.04

-

2002.03

Research Fellow of the Japan Society for the Promotion of Science (DC1)
2002.04

-

2004.03

JSPS Postdoctoral Fellow for Research Abroad
2002.04

-

2004.03

JSPS Postdoctoral Fellow for Research Abroad
2004.04

-

2004.07

Collaborator Scientific
2004.04

-

2004.07

Collaborator Scientific

Academic Background 【 Display / hide 】

1997.03

The University of Tokyo, Faculty of Science, Department of Physics

University, Graduated
1999.03

The University of Tokyo, Graduate School of Science, Physics Department

Graduate School, Completed, Master's course
2002.03

The University of Tokyo, Graduate School of Science, Physics Department

Graduate School, Completed, Doctoral course

Academic Degrees 【 Display / hide 】

Doctor of Science, The University of Tokyo, Coursework, 2002.03

Research Areas 【 Display / hide 】

Natural Science / Semiconductors, optical properties of condensed matter and atomic physics (Physical Properties I)
Nanotechnology/Materials / Optical engineering and photon science (Applied Optics/Quantum Optical Engineering)

Research Keywords 【 Display / hide 】

Terahertz Spectroscopy
Semiconductor Nanostructures
Organic Conductors
Ultrafast Spectroscopy

Books 【 Display / hide 】

基礎高分子科学第２版

渡邉紳一, 2020.01

Papers 【 Display / hide 】

Temporal-offset dual-comb vibrometer with picometer axial precision

A. Iwasaki, D. Nishikawa, M. Okano, S. Tateno, K. Yamanoi, Y. Nozaki, S. Watanabe

2022.03

　View Summary

We demonstrate a dual-comb vibrometer where the pulses of one frequency-comb
are split into pulse pairs. We introduce a delay between the two pulses of each
pulse pair in front of the sample, and after the corresponding two consecutive
reflections at the vibrating sample surface, the initially introduced delay is
cancelled by a modified Sagnac geometry. The remaining phase difference between
the two pulses corresponds to the change in the axial position of the surface
during the two consecutive reflections. The Sagnac geometry reduces the effect
of phase jitter since both pulses propagate through nearly the same optical
path (in opposite directions), and spurious signals are eliminated by time
gating. We determine the amplitude of a surface vibration on a
surface-acoustic-wave device with an axial precision of 4 pm. This technique
enables highly accurate determination of extremely small displacements.
Ultra-precise determination of thicknesses and refractive indices of optically thick dispersive materials by dual-comb spectroscopy.

Kana A Sumihara, Sho Okubo, Makoto Okano, Hajime Inaba, Shinichi Watanabe

Optics express （Optics Express) 30 （ 2 ） 2734 - 2747 2022.01

　View Summary

Precise measurements of the geometrical thickness of a sample and its refractive index are important for materials science, engineering, and medical diagnosis. Among the possible non-contact evaluation methods, optical interferometric techniques possess the potential of providing superior resolution. However, in the optical frequency region, the ambiguity in the absolute phase-shift makes it difficult to measure these parameters of optically thick dispersive materials with sufficient resolution. Here, we demonstrate that dual frequency-comb spectroscopy can be used to precisely determine the absolute sample-induced phase-shift by analyzing the data smoothness. This method enables simultaneous determination of the geometrical thickness and the refractive index of a planar sample with a precision of five and a half digits. The thickness and the refractive index at 193.414 THz (λ = 1550 nm) of a silicon wafer determined by this method are 0.5204737(19) mm and 3.475625(58), respectively, without any prior knowledge of the refractive index.
- Access to Document (DOI)
Interferogram-based determination of the absolute mode numbers of optical frequency combs in dual-comb spectroscopy

Fukuda T, Okano M, Watanabe S

Optics Express （Optics Express) 29 （ 14 ） 22214 - 22227 2021.07

　View Summary

Dual-comb spectroscopy (DCS), which uses two optical frequency combs (OFCs), requires an accurate knowledge of the mode number of each comb line to determine spectral features. We demonstrate a fast evaluation method of the absolute mode numbers of both OFCs used in DCS system. By measuring the interval between the peaks in the time-domain interferogram, it is possible to accurately determine the ratio of one OFC repetition frequency (frep) to the difference between the frep values of the two OFCs (∆frep). The absolute mode numbers can then be straightforwardly calculated using this ratio. This method is applicable to a broad range of ∆frep values down to several Hz without any additional instruments. For instance, the minimum required measurement time is estimated to be about 1 s for ∆frep ≈ 5.6 Hz and frep ≈ 60 MHz. The optical frequencies of the absorption lines of acetylene gas obtained by DCS with our method of mode number determination shows good agreement with the data from the HITRAN database.
- Access to Document (DOI)
Ultra-Precise Complex Refractive Index Measurement Using Dual-Comb Spectroscopy

Sumihara K.A., Okubo S., Okano M., Inaba H., Watanabe S.

2021 Conference on Lasers and Electro-Optics, CLEO 2021 - Proceedings （2021 Conference on Lasers and Electro-Optics, CLEO 2021 - Proceedings) 2021.05

ISSN 9781943580910

　View Summary

We determined complex refractive index and thickness of a silicon wafer with unprecedented precision using dual-comb spectroscopy. The standard deviations of the refractive index and the thickness are 8.9×10-6 and 1.0 nm, respectively.
Ultra-precise complex refractive index measurement using dual-comb spectroscopy

Sumihara K.A., Okubo S., Okano M., Inaba H., Watanabe S.

Optics InfoBase Conference Papers （Optics InfoBase Conference Papers) 2021

ISSN 9781557528209

　View Summary

We determined complex refractive index and thickness of a silicon wafer with unprecedented precision using dual-comb spectroscopy. The standard deviations of the refractive index and the thickness are 8.9×10-6 and 1.0 nm, respectively.

Papers, etc., Registered in KOARA 【 Display / hide 】

Development of time-dependent stain observation system for macromolecular destruction phenomenon probed by terahertz spectroscopy

Watanabe, Shin'ichi

科学研究費補助金研究成果報告書 2020
Development of the polarization-sensitive dual comb spectroscopy

Watanabe, Shinichi

科学研究費補助金研究成果報告書 2017
Research on dynamical process of spinwave-assisted magnetization reversal and observation of spinwaves excited along thickness direction

Watanabe, Shinichi

科学研究費補助金研究成果報告書 2016
Development and application of high speed, high accuracy, and time-dependent spin dynamics imaging measurement system

Watanabe, Shinichi

科学研究費補助金研究成果報告書 2014
Development of the reflection-type terahertz polarizing microscope

Watanabe, Shinichi

科学研究費補助金研究成果報告書 2013

Reviews, Commentaries, etc. 【 Display / hide 】

Polarization-sensitive terahertz time-domain spectroscopy system without mechanical moving parts

Mayuri Nakagawa, Makoto Okano, Shinichi Watanabe

2022.05

　View Summary

We report on the measurement of terahertz electric-field vector waveforms by
using a system that contains no mechanical moving parts. It is known that two
phase-locked femtosecond lasers with different repetition rates can be used to
perform time-domain spectroscopy without using a mechanical delay stage.
Furthermore, an electro-optic modulator can be used to perform polarization
measurements without rotating any polarizers or waveplates. We experimentally
demonstrate the combination of these two methods and explain the analysis of
data obtained by such a system. Such a system provides a robust platform that
can promote the usage of polarization-sensitive terahertz time-domain
spectroscopy in basic science and practical applications. For the experimental
demonstration, we alter the polarization of a terahertz wave by a polarizer.
テラヘルツセンシングで見えるもの～高分子材料評価への応用～

渡邉紳一, 岡野真人

一般財団法人電波技術協会協会報FORN ( 11 ) 2020.11

Article, review, commentary, editorial, etc. (trade magazine, newspaper, online media), Joint Work
テラヘルツ分光技術の化学・生命科学への応用

渡邉紳一

光学 48 ( 10 ) 396 - 401 2019.10

Article, review, commentary, editorial, etc. (scientific journal), Single Work
テラヘルツ偏光計測による高分子材料の内部異方性検査

岡野真人, 渡邉紳一

プラスチックス ( 10 ) 22 - 25 2019.10

Article, review, commentary, editorial, etc. (trade magazine, newspaper, online media), Joint Work
高分子材料における異方性のテラヘルツセンシング

渡邉紳一、岡野真人、中迫雅由

レーザー研究 (一般社団法人レーザー学会) 47 ( 1 ) 21 - 26 2019.02

Article, review, commentary, editorial, etc. (scientific journal), Joint Work

Presentations 【 Display / hide 】

複素誘電率スペクトル解析によるポリ乳酸薄膜の熱誘起状態変化の観測

岡野真人, 中村円香, 渡邉紳一

テラヘルツ科学の最先端VII,

2020.11
,
Oral presentation (general)
非同期サンプリング法によるテラヘルツ偏光分光測定装置の開発

中川真由莉, 岡野真人, 渡邉紳一

テラヘルツ科学の最先端VII,

2020.11
,
Oral presentation (general)
テラヘルツ偏光計測によるゴム伸縮過程における内部カーボンナノフィラー構造変化の推定

水田圭祐, 岡野真人, 森本崇宏, 阿多誠介, 渡邉紳一

日本物理学会2020年秋季大会,

2020.09
,
Poster presentation
ダブル光パルス励起による金属強磁性薄膜中の高次スピン波モードの制御

岡野真人, 高橋知宏, 渡邉紳一

Spin-RNJ 若手オンライン研究発表会,

2020.06
,
Oral presentation (general)
Coherent control of higher-order spin precession modes in ferromagnetic permalloy thin films by double pulse excitation

M. Okano, T. Takahashi, and S. Watanabe

CLEO 2020,

2020.05
,
Oral presentation (general)

Research Projects of Competitive Funds, etc. 【 Display / hide 】

高分子破壊現象プローブのための動的テラヘルツ劣化観察装置の開発

2018.04

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2021.03

Grant-in-Aid for Scientific Research, Research grant, Principal investigator
テラヘルツ偏光イメージング分析技術の成果事業化検証のための装置開発

2017.10

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2018.03

科学技術振興機構, 大学発新産業創出プログラム社会還元加速プログラム（SCORE), Commissioned ｒesearch, Principal investigator
偏光コム分光法の創出

2016.04

-

2018.03

Grant-in-Aid for Scientific Research, Principal investigator
高速・高精度テラヘルツ時間領域分光ポーラリメータの開発と産業応用展開

2014.09

-

2019.03

科学技術振興機構, 産学共創基礎基盤研究プログラム, Commissioned ｒesearch, Principal investigator
高速・高精度テラヘルツ偏光スペクトル計測を用いた非破壊・非接触イメージング技術の研究開発

2014.08

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2015.03

総務省, 戦略的情報通信研究開発推進事業, Commissioned ｒesearch, No Setting

Works 【 Display / hide 】

テラヘルツ光で見るゴム深部のひずみ ─光でミクロの構造に迫る─

渡邉紳一

JSTニュース２０１７年９月号,

2017.09

-

Present
,
Other, Single
日経産業新聞　朝刊８面

2017.01

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Present
,
Other, Joint
化学工業日報　朝刊8面

WATANABE SHINICHI

2012.07

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Present
,
Other
日経産業新聞　朝刊11面

WATANABE SHINICHI

2012.07

-

Present
,
Other
日刊工業新聞　朝刊17面

WATANABE SHINICHI

2012.07

-

Present
,
Other

Intellectual Property Rights, etc. 【 Display / hide 】

光学測定装置、光学測定方法、及び応力検査方法

Date applied： PCT/JP2017/030814 2017.08

Patent, Joint
光学測定装置、光学測定方法、及び応力検査方法

Date applied：特願2016-167370 2016.08

Patent, Joint
デュアルコム分光法を用いた偏光計測装置及び偏光計測方法

Date applied：特願2016-017537 2016.02

Patent, Joint
偏波解析装置、及び偏波解析方法

Date applied：特願2015-124617 2015.06

Patent, Joint

Awards 【 Display / hide 】

IAAM Scientist Medal

Shinichi Watanabe, 2018.05, International Association of Advanced Materials, Terahertz polarization spectroscopy as a novel tool for nondestructive internal strain sensing of rubber and polymeric materials

Country： Sweden

　View Description

New Age Technology and Innovations 分野における著しく優れた研究による
第42回（2017年春季）応用物理学会講演奨励賞受賞

森脇淳仁、岡野真人、渡邉紳一, 2017.09, 応用物理学会, テラヘルツ偏光計測による黒色ゴム材料の内部歪みイメージング
Best Student Papers

K. Sumihara, S. Okubo, M. Okano, H. Inaba, and S. Watanabe, 2017.03, Optical Society of America, Development of Precise Polarization Measurement System Using Dual-comb Spectroscopy
The Commendation for Science and Technology by the Minister of Education, Culture, Sports, Science and Technology, The Young Scientists’ Prize

Shinichi Watanabe, 2014.04, Ministry of Education, Culture, Sports, Science and Technology, テラヘルツ新分光技術の開拓と物質科学応用に関する研究
Young Scientist Award of the Physical Society of Japan

WATANABE SHINICHI, 2012.03, The Physical Society of Japan, Experimental studies on non-equilibrium carrier dynamics in low-dimensional organic materials by time-resolved terahertz spectroscopy

Courses Taught 【 Display / hide 】

SOLID STATE PHYSICS 3

2022
SOLID STATE PHYSICS 1

2022
PHYSICS LABORATORIES 2

2022
PHYSICS LABORATORIES 1

2022
LITERATURE OF PHYSICS

2022

Courses Previously Taught 【 Display / hide 】

物性物理学第１

Keio University

2020.04

-

2021.03
,
Autumn Semester, Lecture
物性物理学第３

Keio University

2020.04

-

2021.03
,
Autumn Semester, Lecture, Lecturer outside of Keio
物理学実験I,II

Keio University

2020.04

-

2021.03
,
Full academic year, Laboratory work/practical work/exercise
論文講読発表

慶應義塾大学

2020.04

-

2021.03
自然科学実験

Keio University

2020.04

-

2021.03
,
Spring Semester, Laboratory work/practical work/exercise

Social Activities 【 Display / hide 】

東京大学理学系ＣＯＥ合同若手シンポジウム実行委員会

2006.02

-

2006.07

　View Summary

物理学専攻教員代表
第10回関東光科学若手研究会企画・運営

2015.04

-

2015.10

Memberships in Academic Societies 【 Display / hide 】

テラヘルツテクノロジーフォーラム委員会,研究交流委員会,基礎部門,

2010.06

-

Present
日本物理学会,

1997.06

-

Present
応用物理学会,

2007.01

-

Present
高分子学会,

2015.10

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Present
The Optical Society (OSA),

2013.01

-

Present

Committee Experiences 【 Display / hide 】

2018.05

-

Present

総務委員会委員長（理事）, テラヘルツテクノロジーフォーラム
2015.04

-

2018.05

総務委員会委員, テラヘルツテクノロジーフォーラム
2015.04

-

2017.03

機関誌編集委員, 応用物理学会
2012.04

-

2014.03

新著紹介小委員会委員, 一般社団法人日本物理学会
2010.06

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Present

委員, テラヘルツテクノロジーフォーラム委員会,研究交流委員会,基礎部門